ICMCTF 2020 IS CANCELLED
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  • Symposia
    • A. Coatings for Use at High Temperatures
    • B. Hard Coatings and Vapor Deposition Technologies
    • C. Fundamentals and Technology of Multifunctional Materials and Devices
    • D. Coatings for Biomedical and Healthcare Applications
    • E. Tribology and Mechanical Behavior of Coatings and Engineered Surfaces
    • F. New Horizons in Coatings and Thin Films
    • G. Surface Engineering – Applied Research and Industrial Applications
    • H. Advanced Characterization Techniques for Coatings, Thin Films, and Small Volumes
    • TS1. Anti- and De-icing Surface Engineering
    • TS2. New Horizons in Boron-Containing Coatings: Modeling, Synthesis and Applications
    • TS3. In-silicio Design of Novel Materials by Quantum Mechanics and Classical Methods
    • TS4. Photocatalytic and Superhydrophilic Surfaces
    • TS5. Thin Films on Polymer Substrates: Flexible Electronics and Beyond
  • Short Courses
    • Plasmas in Physical Vapor Deposition, Including Arcs and HiPIMS – 4/26/20
    • In-situ and Ex-situ Ellipsometry Characterizations of Thin Films – 4/26/20
    • NEW! Design and Deposition of Hard and Superhard Coatings – 4/27/20
    • Reactive Magnetron Sputter Deposition – 4/27/20
    • NEW! Atmospheric Pressure Plasma: Principles, Sources and Applications – 4/28/20
    • Practical Thin Film Characterization – 4/28/20
    • Fundamentals of HiPIMS Plasmas for Thin Film Deposition – 4/29/20
    • Nanomechanics and Tribology of Thin Film Coatings – 4/29/20
    • Industrial Surface Engineering: Fundamentals, Practice and Applications – 4/30/20
    • Understanding and Control Stresses in PVD Thin Films – 4/30/20
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Practical Thin Film Characterization – 4/28/20

Jörg Patscheider
Senior Scientist R&D, Evatec AG, Trübbach, CH

Course Objectives
  • Learn about the wide range of analysis techniques available
  • Understand the basic principles of the analysis techniques
  • Develop insight into the interpretation of the data
  • Learn about strategies for choosing the best combination of techniques
Course Description

The course will outline strategies for most efficient applications on the methods for analysis and characte-rization of thin films and coatings in order to optimize synthesis processes. Characterization techniques will be compared and a sequence of their optimal use will be outlined. Surface, interface and bulk composition as well as phase and microstructure govern the properties of the materials. Deposition techniques and conditions influence the composition and microstructure. Thus materials characterization is a key step in achieving desired coatings’ function. Materials characterization is critical for understanding why coatings work or fail.

Course Content

The use of surface and thin film analysis techniques such as AES, XPS, SIMS and RBS used in the characte-rization of films and coatings will be reviewed. Methods of determining surface and interface composition and elemental distributions will be presented.  A comparative evaluation of these analytical techniques in terms of sensitivity, depth resolution, chemical state identification, and spatial resolution will be discussed. The use of proximal probes such as AFM and STM to determine surface and film roughness and morpho-logy will be highlighted.

The characterization of crystallographic defects and microstructure of surfaces, interfaces, and bulk material using scanning electron (SEM) and transmission electron microscopy (TEM), electron diffraction, and X-ray diffraction will be presented. High-resolution composition analysis using energy dispersive, wavelength dispersive spectroscopy, electron energy loss spectroscopy (EDS, WDS, EELS) will be reviewed.

The principles of these techniques will be reviewed and their application in thin film analysis will be illustra-ted with examples which relate to the materials and deposition process. The relative merits (strengths and weaknesses) of these techniques will be described along with guidelines for their use for specific appli-cations. A strategy for choosing the best combination of techniques will be outlined.

Who should attend?

This course is for individuals at all stages of their career who wish to get a systematic review of the large variety of characterization techniques and develop an understanding for their optimal use. New engineers moving into this field, specialists wanting a broad overview and managers wanting to gain a better understanding will find this course material useful.

Course Materials

Lecture notes will be provided.

Date/Time: Tuesday, April 28, 8:30 a.m.-4:30 p.m.
Cost: $500 Regular/$130 Student

Short Course Registration

All short courses include detailed course notes, morning and afternoon breaks. Lunch is not included in the course registration fee.

Courses run from 8:30 a.m. to 4:30 p.m.

Individual and Company Group discounts available!

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Key Dates

ICMCTF Awards Deadline:
October 1, 2019

Late News Abstract Deadline:
February 5, 2020

Early Registration Deadline:
March 20, 2020

Hotel Reservation Deadline:
March 20, 2020

Manuscript Deadline:
March 20, 2020

Downloads

  • Call for Abstracts FlIer
  • Presentation & Poster Guidelines

Contact

ICMCTF
Yvonne Towse

Conference Administrator
125 Maiden Lane; Suite 15B
New York, N.Y. 10038
icmctf@icmctf.org

 

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